Towards Efficient Pixel Labeling for Industrial Anomaly Detection and Localization
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arXiv
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| Autores principales: | , , , , , |
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| Formato: | Preprint |
| Publicado: |
2024
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| Acceso en línea: | |
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| _version_ | 1866917712751493120 |
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| author | Li, Hanxi Wu, Jingqi Wu, Lin Yuanbo Chen, Hao Liu, Deyin Shen, Chunhua |
| author_facet | Li, Hanxi Wu, Jingqi Wu, Lin Yuanbo Chen, Hao Liu, Deyin Shen, Chunhua |
| contents | In the realm of practical Anomaly Detection (AD) tasks, manual labeling of anomalous pixels proves to be a costly endeavor. Consequently, many AD methods are crafted as one-class classifiers, tailored for training sets completely devoid of anomalies, ensuring a more cost-effective approach. While some pioneering work has demonstrated heightened AD accuracy by incorporating real anomaly samples in training, this enhancement comes at the price of labor-intensive labeling processes. This paper strikes the balance between AD accuracy and labeling expenses by introducing ADClick, a novel Interactive Image Segmentation (IIS) algorithm. ADClick efficiently generates "ground-truth" anomaly masks for real defective images, leveraging innovative residual features and meticulously crafted language prompts. Notably, ADClick showcases a significantly elevated generalization capacity compared to existing state-of-the-art IIS approaches. Functioning as an anomaly labeling tool, ADClick generates high-quality anomaly labels (AP $= 94.1\%$ on MVTec AD) based on only $3$ to $5$ manual click annotations per training image. Furthermore, we extend the capabilities of ADClick into ADClick-Seg, an enhanced model designed for anomaly detection and localization. By fine-tuning the ADClick-Seg model using the weak labels inferred by ADClick, we establish the state-of-the-art performances in supervised AD tasks (AP $= 86.4\%$ on MVTec AD and AP $= 78.4\%$, PRO $= 98.6\%$ on KSDD2). |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2407_03130 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Towards Efficient Pixel Labeling for Industrial Anomaly Detection and Localization Li, Hanxi Wu, Jingqi Wu, Lin Yuanbo Chen, Hao Liu, Deyin Shen, Chunhua Computer Vision and Pattern Recognition In the realm of practical Anomaly Detection (AD) tasks, manual labeling of anomalous pixels proves to be a costly endeavor. Consequently, many AD methods are crafted as one-class classifiers, tailored for training sets completely devoid of anomalies, ensuring a more cost-effective approach. While some pioneering work has demonstrated heightened AD accuracy by incorporating real anomaly samples in training, this enhancement comes at the price of labor-intensive labeling processes. This paper strikes the balance between AD accuracy and labeling expenses by introducing ADClick, a novel Interactive Image Segmentation (IIS) algorithm. ADClick efficiently generates "ground-truth" anomaly masks for real defective images, leveraging innovative residual features and meticulously crafted language prompts. Notably, ADClick showcases a significantly elevated generalization capacity compared to existing state-of-the-art IIS approaches. Functioning as an anomaly labeling tool, ADClick generates high-quality anomaly labels (AP $= 94.1\%$ on MVTec AD) based on only $3$ to $5$ manual click annotations per training image. Furthermore, we extend the capabilities of ADClick into ADClick-Seg, an enhanced model designed for anomaly detection and localization. By fine-tuning the ADClick-Seg model using the weak labels inferred by ADClick, we establish the state-of-the-art performances in supervised AD tasks (AP $= 86.4\%$ on MVTec AD and AP $= 78.4\%$, PRO $= 98.6\%$ on KSDD2). |
| title | Towards Efficient Pixel Labeling for Industrial Anomaly Detection and Localization |
| topic | Computer Vision and Pattern Recognition |
| url | https://arxiv.org/abs/2407.03130 |