Saved in:
Bibliographic Details
Main Authors: Bocquet, Hugo, Kleibert, Armin, Derlet, Peter M.
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2407.03220
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866914857762160640
author Bocquet, Hugo
Kleibert, Armin
Derlet, Peter M.
author_facet Bocquet, Hugo
Kleibert, Armin
Derlet, Peter M.
contents Recent experimental investigations of individual magnetic nanoparticles reveal a diverse range of magnetic relaxation times which cannot be explained by considering their size, shape, and surface anisotropy, suggesting other factors associated with the internal microstructure of the particles are at play. In this letter, we apply Langer's theory of thermal activation to single magnetic domain fcc Co nanoparticles, whose experimental microstructures are characterized by planar defects, and derive an analytic expression for the relaxation time. The obtained Arrhenius exponential and its prefactor, which is often assumed to be a constant, are here found to both depend exponentially on system size and the number of defects. Together they provide a quantitative prediction of the experimental findings, and more generally highlight the importance of structural defects when considering magnetic stability.
format Preprint
id arxiv_https___arxiv_org_abs_2407_03220
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Impact of planar defects on the reversal time of single magnetic domain nanoparticles
Bocquet, Hugo
Kleibert, Armin
Derlet, Peter M.
Mesoscale and Nanoscale Physics
Recent experimental investigations of individual magnetic nanoparticles reveal a diverse range of magnetic relaxation times which cannot be explained by considering their size, shape, and surface anisotropy, suggesting other factors associated with the internal microstructure of the particles are at play. In this letter, we apply Langer's theory of thermal activation to single magnetic domain fcc Co nanoparticles, whose experimental microstructures are characterized by planar defects, and derive an analytic expression for the relaxation time. The obtained Arrhenius exponential and its prefactor, which is often assumed to be a constant, are here found to both depend exponentially on system size and the number of defects. Together they provide a quantitative prediction of the experimental findings, and more generally highlight the importance of structural defects when considering magnetic stability.
title Impact of planar defects on the reversal time of single magnetic domain nanoparticles
topic Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2407.03220