Statistical study and parallelisation of multiplexed single-electron sources
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arXiv
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| Format: | Preprint |
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2024
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| author | Norimoto, S. See, P. Schoinas, N. Rungger, I. Boykin II, T. O. Stewart Jr, M. D. Griffiths, J. P. Chen, C. Ritchie, D. A. Kataoka, M. |
| author_facet | Norimoto, S. See, P. Schoinas, N. Rungger, I. Boykin II, T. O. Stewart Jr, M. D. Griffiths, J. P. Chen, C. Ritchie, D. A. Kataoka, M. |
| contents | Increasing electric current from a single-electron source is a main challenge in an effort to establish the standard of the ampere defined by the fixed value of the elementary charge $e$ and operation frequency $f$. While the current scales with $f$, due to an operation frequency limit for maintaining accurate single-electron transfer, parallelisation of singleelectron sources is expected to be a more practical solution to increase the generated electric current $I = Nef$, where $N$ is a number of parallelised devices. One way to parallelise single-electron sources without increasing the complexity in device operation is to use a common gate. Such a scheme will require each device to have the same operation parameters for single-electron transfer. In order to investigate this possibility, we study the statistics for operation gate voltages using single-electron sources embedded in a multiplexer circuit. The multiplexer circuit allows us to measure 64 single-electron sources individually in a single cooldown. We also demonstrate the parallelisation of three single-electron sources and observe the generated current enhanced by a factor of three. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2407_05926 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Statistical study and parallelisation of multiplexed single-electron sources Norimoto, S. See, P. Schoinas, N. Rungger, I. Boykin II, T. O. Stewart Jr, M. D. Griffiths, J. P. Chen, C. Ritchie, D. A. Kataoka, M. Mesoscale and Nanoscale Physics Increasing electric current from a single-electron source is a main challenge in an effort to establish the standard of the ampere defined by the fixed value of the elementary charge $e$ and operation frequency $f$. While the current scales with $f$, due to an operation frequency limit for maintaining accurate single-electron transfer, parallelisation of singleelectron sources is expected to be a more practical solution to increase the generated electric current $I = Nef$, where $N$ is a number of parallelised devices. One way to parallelise single-electron sources without increasing the complexity in device operation is to use a common gate. Such a scheme will require each device to have the same operation parameters for single-electron transfer. In order to investigate this possibility, we study the statistics for operation gate voltages using single-electron sources embedded in a multiplexer circuit. The multiplexer circuit allows us to measure 64 single-electron sources individually in a single cooldown. We also demonstrate the parallelisation of three single-electron sources and observe the generated current enhanced by a factor of three. |
| title | Statistical study and parallelisation of multiplexed single-electron sources |
| topic | Mesoscale and Nanoscale Physics |
| url | https://arxiv.org/abs/2407.05926 |