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Trikarenos: Design and Experimental Characterization of a Fault-Tolerant 28nm RISC-V-based SoC

Fuente: arXiv

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Bibliographic Details
Main Authors:	Rogenmoser, Michael, Wiese, Philip, Forlin, Bruno Endres, Gürkaynak, Frank K., Rech, Paolo, Menicucci, Alessandra, Ottavi, Marco, Benini, Luca
Format:	Preprint
Published:	2024
Subjects:	Instrumentation and Detectors Hardware Architecture High Energy Physics - Experiment
Online Access:	Acceder al recurso
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