Cohen, R., Shwartz, S., & Cohen, E. (2024). Loss-resilient, efficient x-ray interaction-free measurements.
Cita Chicago Style (17a ed.)Cohen, Ron, Sharon Shwartz, y Eliahu Cohen. Loss-resilient, Efficient X-ray Interaction-free Measurements. 2024.
Cita MLA (9a ed.)Cohen, Ron, et al. Loss-resilient, Efficient X-ray Interaction-free Measurements. 2024.
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