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Analytical Aberration Theory for Plane-symmetric Optical Systems and its Application in the Analysis of Distortion in Freeform Spectrometers

Fuente: arXiv

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Detalles Bibliográficos
Autor principal:	Liu, Yuxuan
Formato:	Preprint
Publicado:	2024
Materias:	Optics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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