Bass, J. M., Ballester, M., Fernández, S. M., Katsaggelos, A. K., Márquez, E., & Willomitzer, F. (2024). An Angular Spectrum Approach to Inverse Synthesis for the Characterization of Optical and Geometrical Properties of Semiconductor Thin Films.
Citazione stile Chigago Style (17a edizione)Bass, John M., Manuel Ballester, Susana M. Fernández, Aggelos K. Katsaggelos, Emilio Márquez, e Florian Willomitzer. An Angular Spectrum Approach to Inverse Synthesis for the Characterization of Optical and Geometrical Properties of Semiconductor Thin Films. 2024.
Citatione MLA (9a ed.)Bass, John M., et al. An Angular Spectrum Approach to Inverse Synthesis for the Characterization of Optical and Geometrical Properties of Semiconductor Thin Films. 2024.
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