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Multiparameter admittance spectroscopy for investigating defects in MoS${_2}$ thin film MOSFETs

Fuente: arXiv

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Bibliographic Details
Main Authors:	Reato, Eros, Esteki, Ardeshir, Ku, Benny, Wang, Zhenxing, Heuken, Michael, Lemme, Max C., Engström, Olof
Format:	Preprint
Published:	2024
Subjects:	Applied Physics
Online Access:	Acceder al recurso
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