Multiparameter admittance spectroscopy for investigating defects in MoS${_2}$ thin film MOSFETs

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Main Authors: Reato, Eros, Esteki, Ardeshir, Ku, Benny, Wang, Zhenxing, Heuken, Michael, Lemme, Max C., Engström, Olof
Format: Preprint
Published: 2024
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