Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by Scanning Precession Electron Diffraction Tomography

Fuente: arXiv

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Bibliographic Details
Main Authors:	Rauch, E. F., Harrison, Patrick, Das, Saurabh Mohan, Goncalves, William, Da Silva, Alessandra, Chen, Xinren, Viganò, Nicola, Liebscher, Christian H., Ludwig, Wolfgang, Zhou, Xuyang
Format:	Preprint
Published:	2024
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2407.08251