Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by Scanning Precession Electron Diffraction Tomography
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arXiv
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| Main Authors: | Rauch, E. F., Harrison, Patrick, Das, Saurabh Mohan, Goncalves, William, Da Silva, Alessandra, Chen, Xinren, Viganò, Nicola, Liebscher, Christian H., Ludwig, Wolfgang, Zhou, Xuyang |
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| Format: | Preprint |
| Published: |
2024
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