On goodness-of-fit testing for self-exciting point processes

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kling, José C. F., Vetter, Mathias
Format:	Preprint
Published:	2024
Subjects:	Statistics Theory Methodology
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2407.09130