High-Throughput Identification and Statistical Analysis of Atomically Thin Semiconductors

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Crimmann, Juri G., Junker, Moritz N., Glauser, Yannik M., Lassaline, Nolan, Nagamine, Gabriel, Norris, David J.
Format: Preprint
Published: 2024
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!