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High-Throughput Identification and Statistical Analysis of Atomically Thin Semiconductors

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Crimmann, Juri G., Junker, Moritz N., Glauser, Yannik M., Lassaline, Nolan, Nagamine, Gabriel, Norris, David J.
Format:	Preprint
Publié:	2024
Sujets:	Mesoscale and Nanoscale Physics Materials Science
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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