A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy
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arXiv
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| Autori principali: | , , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2024
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| Soggetti: | |
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| _version_ | 1866916441465290752 |
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| author | Dyck, Ondrej Olunloyo, Olugbenga Xiao, Kai Wolf, Benjamin Moore, Thomas M. Lupini, Andrew R. Jesse, Stephen |
| author_facet | Dyck, Ondrej Olunloyo, Olugbenga Xiao, Kai Wolf, Benjamin Moore, Thomas M. Lupini, Andrew R. Jesse, Stephen |
| contents | We present the design and implementation of a side entry laser system designed for an ultra-high vacuum scanning transmission electron microscope. This system uses a versatile probe design enclosed in a vacuum envelope such that parts can be easily aligned, modified, or exchanged without disturbing the vacuum. The system uses a mirror mounted on the sample holder such that the sample can be illuminated without being tilted. Notably the mirror can be removed and replaced with an ablation target and a higher power laser used to ablate material directly onto the sample. We argue that new capabilities hold the potential to transform the electron microscope from an analysis tool towards a more flexible synthesis system, where atomic scale fabrication and atom-by-atom experiments can be performed. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2407_09461 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy Dyck, Ondrej Olunloyo, Olugbenga Xiao, Kai Wolf, Benjamin Moore, Thomas M. Lupini, Andrew R. Jesse, Stephen Applied Physics Materials Science We present the design and implementation of a side entry laser system designed for an ultra-high vacuum scanning transmission electron microscope. This system uses a versatile probe design enclosed in a vacuum envelope such that parts can be easily aligned, modified, or exchanged without disturbing the vacuum. The system uses a mirror mounted on the sample holder such that the sample can be illuminated without being tilted. Notably the mirror can be removed and replaced with an ablation target and a higher power laser used to ablate material directly onto the sample. We argue that new capabilities hold the potential to transform the electron microscope from an analysis tool towards a more flexible synthesis system, where atomic scale fabrication and atom-by-atom experiments can be performed. |
| title | A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy |
| topic | Applied Physics Materials Science |
| url | https://arxiv.org/abs/2407.09461 |