APA (7th ed.) Citation

Dey, B., De Ridder, V., Blanco, V., Halder, S., & Van Waeyenberge, B. (2024). Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images.

Chicago Style (17th ed.) Citation

Dey, Bappaditya, Vic De Ridder, Victor Blanco, Sandip Halder, and Bartel Van Waeyenberge. Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images. 2024.

MLA (9th ed.) Citation

Dey, Bappaditya, et al. Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images. 2024.