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FabGPT: An Efficient Large Multimodal Model for Complex Wafer Defect Knowledge Queries

Fuente: arXiv

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Bibliographic Details
Main Authors:	Jiang, Yuqi, Lu, Xudong, Jin, Qian, Sun, Qi, Wu, Hanming, Zhuo, Cheng
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence Hardware Architecture Machine Learning
Online Access:	Acceder al recurso
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