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Main Authors: Hazra, S., Dai, W., Connolly, T., Kurilovich, P. D., Wang, Z., Frunzio, L., Devoret, M. H.
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2407.10934
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_version_ 1866915370895409152
author Hazra, S.
Dai, W.
Connolly, T.
Kurilovich, P. D.
Wang, Z.
Frunzio, L.
Devoret, M. H.
author_facet Hazra, S.
Dai, W.
Connolly, T.
Kurilovich, P. D.
Wang, Z.
Frunzio, L.
Devoret, M. H.
contents Readout of superconducting qubits faces a trade-off between measurement speed and unwanted back-action on the qubit caused by the readout drive, such as $T_1$ degradation and leakage out of the computational subspace. The readout is typically benchmarked by integrating the readout signal and choosing a binary threshold to extract the "readout fidelity". We show that readout fidelity may significantly overlook readout-induced leakage errors. Such errors are detrimental for applications that rely on continuously repeated measurements, e.g., quantum error correction. We introduce a method to measure the readout-induced leakage rate by repeatedly executing a composite operation - a readout preceded by a randomized qubit-flip. We apply this technique to characterize the readout of a superconducting qubit, optimized for fidelity across four different readout durations. Our technique highlights the importance of an independent leakage characterization by showing that the leakage rates vary from $0.12\%$ to $7.76\%$ across these readouts even though the fidelity exceeds $99.5\%$ in all four cases.
format Preprint
id arxiv_https___arxiv_org_abs_2407_10934
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Benchmarking the readout of a superconducting qubit for repeated measurements
Hazra, S.
Dai, W.
Connolly, T.
Kurilovich, P. D.
Wang, Z.
Frunzio, L.
Devoret, M. H.
Quantum Physics
Applied Physics
Readout of superconducting qubits faces a trade-off between measurement speed and unwanted back-action on the qubit caused by the readout drive, such as $T_1$ degradation and leakage out of the computational subspace. The readout is typically benchmarked by integrating the readout signal and choosing a binary threshold to extract the "readout fidelity". We show that readout fidelity may significantly overlook readout-induced leakage errors. Such errors are detrimental for applications that rely on continuously repeated measurements, e.g., quantum error correction. We introduce a method to measure the readout-induced leakage rate by repeatedly executing a composite operation - a readout preceded by a randomized qubit-flip. We apply this technique to characterize the readout of a superconducting qubit, optimized for fidelity across four different readout durations. Our technique highlights the importance of an independent leakage characterization by showing that the leakage rates vary from $0.12\%$ to $7.76\%$ across these readouts even though the fidelity exceeds $99.5\%$ in all four cases.
title Benchmarking the readout of a superconducting qubit for repeated measurements
topic Quantum Physics
Applied Physics
url https://arxiv.org/abs/2407.10934