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TCAD modeling of radiation-induced defects in 4H-SiC diodes

Fuente: arXiv

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Bibliographic Details
Main Authors:	Gaggl, Philipp, Burin, Jürgen, Gsponer, Andreas, Waid, Simon Emanuel, Thalmeier, Richard, Bergauer, Thomas
Format:	Preprint
Published:	2024
Subjects:	Instrumentation and Detectors
Online Access:	Acceder al recurso
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