A Quality-Aware Voltage Overscaling Framework to Improve the Energy Efficiency and Lifetime of TPUs based on Statistical Error Modeling

Fuente: arXiv

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Bibliographic Details
Main Authors:	Senobari, Alireza, Vafaei, Jafar, Akbari, Omid, Hochberger, Christian, Shafique, Muhammad
Format:	Preprint
Published:	2024
Subjects:	Hardware Architecture
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2407.12029