APA (7th ed.) Citation

Prasad, A., Dey, B., Blanco, V., & Halder, S. (2024). An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection.

Chicago Style (17th ed.) Citation

Prasad, Amit, Bappaditya Dey, Victor Blanco, and Sandip Halder. An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection. 2024.

MLA (9th ed.) Citation

Prasad, Amit, et al. An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection. 2024.