Designing fault-tolerant circuits using detector error models

Fuente: arXiv
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Auteurs principaux: Derks, Peter-Jan H. S., Townsend-Teague, Alex, Burchards, Ansgar G., Eisert, Jens
Format: Preprint
Publié: 2024
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author Derks, Peter-Jan H. S.
Townsend-Teague, Alex
Burchards, Ansgar G.
Eisert, Jens
author_facet Derks, Peter-Jan H. S.
Townsend-Teague, Alex
Burchards, Ansgar G.
Eisert, Jens
contents Quantum error-correcting codes, such as subspace, subsystem, and Floquet codes, are typically constructed within the stabilizer formalism, which does not fully capture the idea of fault-tolerance needed for practical quantum computing applications. In this work, we explore the remarkably powerful formalism of detector error models, which fully captures fault-tolerance at the circuit level. We introduce the detector error model formalism in a pedagogical manner and provide several examples. Additionally, we apply the formalism to three different levels of abstraction in the engineering cycle of fault-tolerant circuit designs: finding robust syndrome extraction circuits, identifying efficient measurement schedules, and constructing fault-tolerant procedures. We enhance the surface code's resistance to measurement errors, devise short measurement schedules for color codes, and implement a more efficient fault-tolerant method for measuring logical operators.
format Preprint
id arxiv_https___arxiv_org_abs_2407_13826
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Designing fault-tolerant circuits using detector error models
Derks, Peter-Jan H. S.
Townsend-Teague, Alex
Burchards, Ansgar G.
Eisert, Jens
Quantum Physics
Quantum error-correcting codes, such as subspace, subsystem, and Floquet codes, are typically constructed within the stabilizer formalism, which does not fully capture the idea of fault-tolerance needed for practical quantum computing applications. In this work, we explore the remarkably powerful formalism of detector error models, which fully captures fault-tolerance at the circuit level. We introduce the detector error model formalism in a pedagogical manner and provide several examples. Additionally, we apply the formalism to three different levels of abstraction in the engineering cycle of fault-tolerant circuit designs: finding robust syndrome extraction circuits, identifying efficient measurement schedules, and constructing fault-tolerant procedures. We enhance the surface code's resistance to measurement errors, devise short measurement schedules for color codes, and implement a more efficient fault-tolerant method for measuring logical operators.
title Designing fault-tolerant circuits using detector error models
topic Quantum Physics
url https://arxiv.org/abs/2407.13826