High-dimensional log contrast models with measurement errors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Tan, Wenxi, Xue, Lingzhou, Yang, Songshan, Zhan, Xiang
Format:	Preprint
Published:	2024
Subjects:	Methodology Applications
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2407.15084