Saved in:
Bibliographic Details
Main Authors: Liffredo, Marco, Peretti, Federico, Xu, Nan, Stettler, Silvan, Villanueva, Luis Guillermo
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2407.15213
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866913439628132352
author Liffredo, Marco
Peretti, Federico
Xu, Nan
Stettler, Silvan
Villanueva, Luis Guillermo
author_facet Liffredo, Marco
Peretti, Federico
Xu, Nan
Stettler, Silvan
Villanueva, Luis Guillermo
contents Deep Ultraviolet (DUV) Photolithography is currently used to fabricate mass-scale integrated circuits (ICs). Its high throughput and resolution could benefit large-scale RF MEMS production for the telecommunication market. We present a process flow to fabricate suspended acoustic resonators using DUV Photolithography. This method allows for scalable production of resonators with critical dimensions of 250 nm and alignment accuracy of less than 100 nm. We show how photoresists and anti-reflective coatings integrate with the process, help with deposition quality and resolution, and how Ion Beam Etching allows for vertical sidewalls of the resonators. We measure resonance frequencies (fr) up to 7.5 GHz and electromechanical couplings up to 8%, and we investigate the uniformity of this process by analyzing the deviation of fs over the wafer surface for four main resonance modes. We show that the deviation of the S0 mode can be kept below 1%. These results indicate the suitability of this process for quick scale-up of Lamb wave resonator technology, bridging the gap from research to industry.
format Preprint
id arxiv_https___arxiv_org_abs_2407_15213
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle More-than-Moore Microacoustics: A Scalable Fabrication Process for Suspended Lamb Wave Resonators
Liffredo, Marco
Peretti, Federico
Xu, Nan
Stettler, Silvan
Villanueva, Luis Guillermo
Systems and Control
Deep Ultraviolet (DUV) Photolithography is currently used to fabricate mass-scale integrated circuits (ICs). Its high throughput and resolution could benefit large-scale RF MEMS production for the telecommunication market. We present a process flow to fabricate suspended acoustic resonators using DUV Photolithography. This method allows for scalable production of resonators with critical dimensions of 250 nm and alignment accuracy of less than 100 nm. We show how photoresists and anti-reflective coatings integrate with the process, help with deposition quality and resolution, and how Ion Beam Etching allows for vertical sidewalls of the resonators. We measure resonance frequencies (fr) up to 7.5 GHz and electromechanical couplings up to 8%, and we investigate the uniformity of this process by analyzing the deviation of fs over the wafer surface for four main resonance modes. We show that the deviation of the S0 mode can be kept below 1%. These results indicate the suitability of this process for quick scale-up of Lamb wave resonator technology, bridging the gap from research to industry.
title More-than-Moore Microacoustics: A Scalable Fabrication Process for Suspended Lamb Wave Resonators
topic Systems and Control
url https://arxiv.org/abs/2407.15213