YOLO-pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images

Fuente: arXiv

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Bibliographic Details
Main Authors:	Liu, Bowen, Chen, Dongjie, Qi, Xiao
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2407.15427