YOLO-pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images
Fuente:
arXiv
Guardado en:
| Autores principales: | Liu, Bowen, Chen, Dongjie, Qi, Xiao |
|---|---|
| Formato: | Preprint |
| Publicado: |
2024
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| Materias: | |
| Acceso en línea: | |
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