Saxon, M., Holtzman, A., West, P., Wang, W. Y., & Saphra, N. (2024). Benchmarks as Microscopes: A Call for Model Metrology.
Cita Chicago Style (17a ed.)Saxon, Michael, Ari Holtzman, Peter West, William Yang Wang, y Naomi Saphra. Benchmarks as Microscopes: A Call for Model Metrology. 2024.
Cita MLA (9a ed.)Saxon, Michael, et al. Benchmarks as Microscopes: A Call for Model Metrology. 2024.
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