Saxon, M., Holtzman, A., West, P., Wang, W. Y., & Saphra, N. (2024). Benchmarks as Microscopes: A Call for Model Metrology.
Chicago Style (17th ed.) CitationSaxon, Michael, Ari Holtzman, Peter West, William Yang Wang, and Naomi Saphra. Benchmarks as Microscopes: A Call for Model Metrology. 2024.
MLA (9th ed.) CitationSaxon, Michael, et al. Benchmarks as Microscopes: A Call for Model Metrology. 2024.
Warning: These citations may not always be 100% accurate.