Analysis of Scalable Anomalous Reflectors through Ray Tracing and Measurements

Fuente: arXiv

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Bibliographic Details
Main Authors:	Hao, Le, Vuyyuru, Sravan K. R., Tretyakov, Sergei A., Rupp, Markus, Valkonen, Risto
Format:	Preprint
Published:	2024
Subjects:	Signal Processing
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2407.17279