Direct Optical Probing of the Magnetic Properties of the Layered Antiferromagnet CrPS$_4$

Fuente: arXiv
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Hauptverfasser: Fąs, Tomasz, Wlazło, Mateusz, Birowska, Magdalena, Rybak, Miłosz, Zinkiewicz, Małgorzata, Oleschko, Leon, Goryca, Mateusz, Gondek, Łukasz, Camargo, Bruno, Szczytko, Jacek, Budniak, Adam K., Amouyal, Yaron, Lifshitz, Efrat, Suffczyński, Jan
Format: Preprint
Veröffentlicht: 2024
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author Fąs, Tomasz
Wlazło, Mateusz
Birowska, Magdalena
Rybak, Miłosz
Zinkiewicz, Małgorzata
Oleschko, Leon
Goryca, Mateusz
Gondek, Łukasz
Camargo, Bruno
Szczytko, Jacek
Budniak, Adam K.
Amouyal, Yaron
Lifshitz, Efrat
Suffczyński, Jan
author_facet Fąs, Tomasz
Wlazło, Mateusz
Birowska, Magdalena
Rybak, Miłosz
Zinkiewicz, Małgorzata
Oleschko, Leon
Goryca, Mateusz
Gondek, Łukasz
Camargo, Bruno
Szczytko, Jacek
Budniak, Adam K.
Amouyal, Yaron
Lifshitz, Efrat
Suffczyński, Jan
contents Unusual magnetic properties of Van der Waals type antiferromagnetic semiconductors make them highly attractive for spintronics and optoelectronics. A link between the magnetic and optical properties of those materials, required for practical applications, has not been, however, established so far. Here, we report on a combined experimental and theoretical study of magnetic, optical, and structural properties of bulk CrPS$_{4}$ samples. We find that the magnetic-field-dependent circular polarization degree of the photoluminescence is a direct measure of the net magnetization of CrPS$_{4}$. Complementary, Raman scattering measured as a function of magnetic field and temperature enables the determination of the magnetic susceptibility curve of the material. Our experimental results are backed by Our experimental results are supported by density functional theory calculations that take as input the lattice parameters determined from temperature-dependent X-ray diffraction measurements. This allows us to explain the impact of spin ordering on the spectral position of Raman transitions in CrPS$_4$, as well as anomalous temperature shifts of selected of them. The presented method for all-optical determination of the magnetic properties is highly promising for studies of spin ordering and magnetic phase transitions in single- or a few-layer samples of magnetic layered materials, for which a poor signal-to-noise ratio precludes any reliable neutron scattering or magnetometry measurements.
format Preprint
id arxiv_https___arxiv_org_abs_2407_17912
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Direct Optical Probing of the Magnetic Properties of the Layered Antiferromagnet CrPS$_4$
Fąs, Tomasz
Wlazło, Mateusz
Birowska, Magdalena
Rybak, Miłosz
Zinkiewicz, Małgorzata
Oleschko, Leon
Goryca, Mateusz
Gondek, Łukasz
Camargo, Bruno
Szczytko, Jacek
Budniak, Adam K.
Amouyal, Yaron
Lifshitz, Efrat
Suffczyński, Jan
Materials Science
Unusual magnetic properties of Van der Waals type antiferromagnetic semiconductors make them highly attractive for spintronics and optoelectronics. A link between the magnetic and optical properties of those materials, required for practical applications, has not been, however, established so far. Here, we report on a combined experimental and theoretical study of magnetic, optical, and structural properties of bulk CrPS$_{4}$ samples. We find that the magnetic-field-dependent circular polarization degree of the photoluminescence is a direct measure of the net magnetization of CrPS$_{4}$. Complementary, Raman scattering measured as a function of magnetic field and temperature enables the determination of the magnetic susceptibility curve of the material. Our experimental results are backed by Our experimental results are supported by density functional theory calculations that take as input the lattice parameters determined from temperature-dependent X-ray diffraction measurements. This allows us to explain the impact of spin ordering on the spectral position of Raman transitions in CrPS$_4$, as well as anomalous temperature shifts of selected of them. The presented method for all-optical determination of the magnetic properties is highly promising for studies of spin ordering and magnetic phase transitions in single- or a few-layer samples of magnetic layered materials, for which a poor signal-to-noise ratio precludes any reliable neutron scattering or magnetometry measurements.
title Direct Optical Probing of the Magnetic Properties of the Layered Antiferromagnet CrPS$_4$
topic Materials Science
url https://arxiv.org/abs/2407.17912