Optimizing ToF-SIMS Depth Profiles of Semiconductor Heterostructures

Fuente: arXiv

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Bibliographic Details
Main Authors:	Tröger, Jan, Kersting, Reinhard, Hagenhoff, Birgit, Bougeard, Dominique, Abrosimov, Nikolay V., Klos, Jan, Schreiber, Lars R., Bracht, Hartmut
Format:	Preprint
Published:	2024
Subjects:	Applied Physics Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2407.17985