_version_ 1866910776654036992
author Rinella, Gianluca Aglieri
Aglietta, Luca
Antonelli, Matias
Barile, Francesco
Benotto, Franco
Beolè, Stefania Maria
Botta, Elena
Bruno, Giuseppe Eugenio
Carnesecchi, Francesca
Colella, Domenico
Colelli, Angelo
Contin, Giacomo
De Robertis, Giuseppe
Dumitrache, Florina
Elia, Domenico
Ferrero, Chiara
Fransen, Martin
Kluge, Alex
Kumar, Shyam
Lemoine, Corentin
Licciulli, Francesco
Lim, Bong-Hwi
Loddo, Flavio
Mager, Magnus
Marras, Davide
Martinengo, Paolo
Pastore, Cosimo
Patra, Rajendra Nath
Perciballi, Stefania
Piro, Francesco
Prino, Francesco
Ramello, Luciano
Ramos, Arianna Grisel Torres
Reidt, Felix
Russo, Roberto
Sarritzu, Valerio
Savino, Umberto
Schledewitz, David
Selina, Mariia
Senyukov, Serhiy
Sitta, Mario
Snoeys, Walter
Sonneveld, Jory
Suljic, Miljenko
Triloki, Triloki
Turcato, Andrea
author_facet Rinella, Gianluca Aglieri
Aglietta, Luca
Antonelli, Matias
Barile, Francesco
Benotto, Franco
Beolè, Stefania Maria
Botta, Elena
Bruno, Giuseppe Eugenio
Carnesecchi, Francesca
Colella, Domenico
Colelli, Angelo
Contin, Giacomo
De Robertis, Giuseppe
Dumitrache, Florina
Elia, Domenico
Ferrero, Chiara
Fransen, Martin
Kluge, Alex
Kumar, Shyam
Lemoine, Corentin
Licciulli, Francesco
Lim, Bong-Hwi
Loddo, Flavio
Mager, Magnus
Marras, Davide
Martinengo, Paolo
Pastore, Cosimo
Patra, Rajendra Nath
Perciballi, Stefania
Piro, Francesco
Prino, Francesco
Ramello, Luciano
Ramos, Arianna Grisel Torres
Reidt, Felix
Russo, Roberto
Sarritzu, Valerio
Savino, Umberto
Schledewitz, David
Selina, Mariia
Senyukov, Serhiy
Sitta, Mario
Snoeys, Walter
Sonneveld, Jory
Suljic, Miljenko
Triloki, Triloki
Turcato, Andrea
contents In the context of the CERN EP R&D on monolithic sensors and the ALICE ITS3 upgrade, the Tower Partners Semiconductor Co (TPSCo) 65 nm process has been qualified for use in high energy physics, and adopted for the ALICE ITS3 upgrade. An Analog Pixel Test Structure (APTS) featuring fast per pixel operational-amplifier-based buffering for a small matrix of four by four pixels, with a sensor with a small collection electrode and a very non-uniform electric field, was designed to allow detailed characterization of the pixel performance in this technology. Several variants of this chip with different pixel designs have been characterized with a (120 GeV/$c$) positive hadron beam. This result indicates that the APTS-OA prototype variants with the best performance achieve a time resolution of 63 ps with a detection efficiency exceeding 99% and a spatial resolution of 2 $μ$m, highlighting the potential of TPSCo 65nm CMOS imaging technology for high-energy physics and other fields requiring precise time measurement, high detection efficiency, and excellent spatial resolution.
format Preprint
id arxiv_https___arxiv_org_abs_2407_18528
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Time performance of Analog Pixel Test Structures with in-chip operational amplifier implemented in 65 nm CMOS imaging process
Rinella, Gianluca Aglieri
Aglietta, Luca
Antonelli, Matias
Barile, Francesco
Benotto, Franco
Beolè, Stefania Maria
Botta, Elena
Bruno, Giuseppe Eugenio
Carnesecchi, Francesca
Colella, Domenico
Colelli, Angelo
Contin, Giacomo
De Robertis, Giuseppe
Dumitrache, Florina
Elia, Domenico
Ferrero, Chiara
Fransen, Martin
Kluge, Alex
Kumar, Shyam
Lemoine, Corentin
Licciulli, Francesco
Lim, Bong-Hwi
Loddo, Flavio
Mager, Magnus
Marras, Davide
Martinengo, Paolo
Pastore, Cosimo
Patra, Rajendra Nath
Perciballi, Stefania
Piro, Francesco
Prino, Francesco
Ramello, Luciano
Ramos, Arianna Grisel Torres
Reidt, Felix
Russo, Roberto
Sarritzu, Valerio
Savino, Umberto
Schledewitz, David
Selina, Mariia
Senyukov, Serhiy
Sitta, Mario
Snoeys, Walter
Sonneveld, Jory
Suljic, Miljenko
Triloki, Triloki
Turcato, Andrea
Instrumentation and Detectors
In the context of the CERN EP R&D on monolithic sensors and the ALICE ITS3 upgrade, the Tower Partners Semiconductor Co (TPSCo) 65 nm process has been qualified for use in high energy physics, and adopted for the ALICE ITS3 upgrade. An Analog Pixel Test Structure (APTS) featuring fast per pixel operational-amplifier-based buffering for a small matrix of four by four pixels, with a sensor with a small collection electrode and a very non-uniform electric field, was designed to allow detailed characterization of the pixel performance in this technology. Several variants of this chip with different pixel designs have been characterized with a (120 GeV/$c$) positive hadron beam. This result indicates that the APTS-OA prototype variants with the best performance achieve a time resolution of 63 ps with a detection efficiency exceeding 99% and a spatial resolution of 2 $μ$m, highlighting the potential of TPSCo 65nm CMOS imaging technology for high-energy physics and other fields requiring precise time measurement, high detection efficiency, and excellent spatial resolution.
title Time performance of Analog Pixel Test Structures with in-chip operational amplifier implemented in 65 nm CMOS imaging process
topic Instrumentation and Detectors
url https://arxiv.org/abs/2407.18528