Improving the Accuracy of Temperature Measurement on TEM samples using Plasmon Energy Expansion Thermometry (PEET): Addressing Sample Thickness Effects

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yang, Yi-Chieh, Serafin, Luca, Gauquelin, Nicolas, Verbeeck, Johan, Jinschek, Joerg R.
Format:	Preprint
Published:	2024
Subjects:	Materials Science Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2407.20059