Hu, Z., Schlosser, T., Friedrich, M., Silva, A. L. V. e., Beuth, F., & Kowerko, D. (2024). Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects.
Chicago Style (17th ed.) CitationHu, Zhining, Tobias Schlosser, Michael Friedrich, André Luiz Vieira e. Silva, Frederik Beuth, and Danny Kowerko. Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects. 2024.
MLA (9th ed.) CitationHu, Zhining, et al. Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects. 2024.
Warning: These citations may not always be 100% accurate.