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Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects

Fuente: arXiv

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Bibliographic Details
Main Authors:	Hu, Zhining, Schlosser, Tobias, Friedrich, Michael, Silva, André Luiz Vieira e, Beuth, Frederik, Kowerko, Danny
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Machine Learning Image and Video Processing
Online Access:	Acceder al recurso
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