Shi, Q., Wei, J., Shen, F., & Zhang, Z. (2024). Few-shot Defect Image Generation based on Consistency Modeling.
Citazione stile Chigago Style (17a edizione)Shi, Qingfeng, Jing Wei, Fei Shen, e Zhengtao Zhang. Few-shot Defect Image Generation Based on Consistency Modeling. 2024.
Citatione MLA (9a ed.)Shi, Qingfeng, et al. Few-shot Defect Image Generation Based on Consistency Modeling. 2024.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.