Synthetic dual image generation for reduction of labeling efforts in semantic segmentation of micrographs with a customized metric function

Fuente: arXiv

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Bibliographic Details
Main Authors:	Stern, Matias Oscar Volman, Hohs, Dominic, Jansche, Andreas, Bernthaler, Timo, Schneider, Gerhard
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Computational Engineering, Finance, and Science Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2408.00707