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Accelerating Domain-Aware Electron Microscopy Analysis Using Deep Learning Models with Synthetic Data and Image-Wide Confidence Scoring

Fuente: arXiv

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Bibliographic Details
Main Authors:	Lynch, Matthew J., Jacobs, Ryan, Bruno, Gabriella, Patki, Priyam, Morgan, Dane, Field, Kevin G.
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Materials Science
Online Access:	Acceder al recurso
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