Scientific Exploration with Expert Knowledge (SEEK) in Autonomous Scanning Probe Microscopy with Active Learning

Fuente: arXiv

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Bibliographic Details
Main Authors:	Pratiush, Utkarsh, Funakubo, Hiroshi, Vasudevan, Rama, Kalinin, Sergei V., Liu, Yongtao
Format:	Preprint
Published:	2024
Subjects:	Materials Science Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2408.02071