Hao, Y., De Backer, A., Findlay, S. D., & Van Aert, S. (2024). Towards atom counting from first moment STEM images: Methodology and possibilities.
Cita Chicago Style (17a ed.)Hao, Yansong, Annick De Backer, Scott David Findlay, y Sandra Van Aert. Towards Atom Counting from First Moment STEM Images: Methodology and Possibilities. 2024.
Cita MLA (9a ed.)Hao, Yansong, et al. Towards Atom Counting from First Moment STEM Images: Methodology and Possibilities. 2024.
Precaución: Estas citas no son 100% exactas.