Phonon-Induced Exchange Gate Infidelities in Semiconducting Si-SiGe Spin Qubits

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Hauptverfasser: Brooks, Matthew, Lundgren, Rex, Tahan, Charles
Format: Preprint
Veröffentlicht: 2024
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author Brooks, Matthew
Lundgren, Rex
Tahan, Charles
author_facet Brooks, Matthew
Lundgren, Rex
Tahan, Charles
contents Spin-spin exchange interactions between semiconductor spin qubits allow for fast single and two-qubit gates. During exchange, coupling of the qubits to a surrounding phonon bath may cause errors in the resulting gate. Here, the fidelities of exchange operations with semiconductor double quantum dot spin qubits in a Si-SiGe heterostructure coupled to a finite temperature phonon bath are considered. By employing a master equation approach, the isolated effect of each spin-phonon coupling term may be resolved, as well as leakage errors of encoded qubit operations. As the temperature is increased, a crossover is observed from where the primary source of error is due to a phonon induced perturbation of the two electron spin states, to one where the phonon induced coupling to an excited orbital state becomes the dominant error. Additionally, it is shown that a simple trade-off in pulse shape and length can improve robustness to spin-phonon induced errors during gate operations by up to an order of magnitude. Our results suggest that for elevated temperatures within 200-300 mK, exchange gate operations are not currently limited by bulk phonons. This is consistent with recent experiments.
format Preprint
id arxiv_https___arxiv_org_abs_2408_02742
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Phonon-Induced Exchange Gate Infidelities in Semiconducting Si-SiGe Spin Qubits
Brooks, Matthew
Lundgren, Rex
Tahan, Charles
Mesoscale and Nanoscale Physics
Other Condensed Matter
Quantum Physics
Spin-spin exchange interactions between semiconductor spin qubits allow for fast single and two-qubit gates. During exchange, coupling of the qubits to a surrounding phonon bath may cause errors in the resulting gate. Here, the fidelities of exchange operations with semiconductor double quantum dot spin qubits in a Si-SiGe heterostructure coupled to a finite temperature phonon bath are considered. By employing a master equation approach, the isolated effect of each spin-phonon coupling term may be resolved, as well as leakage errors of encoded qubit operations. As the temperature is increased, a crossover is observed from where the primary source of error is due to a phonon induced perturbation of the two electron spin states, to one where the phonon induced coupling to an excited orbital state becomes the dominant error. Additionally, it is shown that a simple trade-off in pulse shape and length can improve robustness to spin-phonon induced errors during gate operations by up to an order of magnitude. Our results suggest that for elevated temperatures within 200-300 mK, exchange gate operations are not currently limited by bulk phonons. This is consistent with recent experiments.
title Phonon-Induced Exchange Gate Infidelities in Semiconducting Si-SiGe Spin Qubits
topic Mesoscale and Nanoscale Physics
Other Condensed Matter
Quantum Physics
url https://arxiv.org/abs/2408.02742