Stacking fault segregation imaging with analytical field ion microscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Morgado, F. F., Stephenson, L. T., Bhatt, S., Freysoldt, C., Neumeier, S., Katnagallu, S., Subramanyam, A. P. A., Pietka, I., Hammerschmidt, T., Vurpillot, F., Gault, B.
Format:	Preprint
Published:	2024
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2408.03167