Probing electron trapping by current collapse in GaN/AlGaN FETs utilizing quantum transport characteristics

Fuente: arXiv

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Bibliographic Details
Main Authors:	Abe, Takaya, Shinozaki, Motoya, Matsumura, Kazuma, Aizawa, Takumi, Kumasaka, Takeshi, Ito, Norikazu, Tanaka, Taketoshi, Nakahara, Ken, Otsuka, Tomohiro
Format:	Preprint
Published:	2024
Subjects:	Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2408.04109