Ionic structure, Liquid-liquid phase transitions, X-Ray diffraction, and X-Ray Thomson scattering in shock compressed liquid Silicon in the 100-200 GPa regime

Fuente: arXiv
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Bibliographic Details
Main Authors: Dharma-wardana, M. W. C., Klug, Dennis D., Poole, Hannah, Gregori, G.
Format: Preprint
Published: 2024
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