Nanoroughness induced anti-reflection and haze effects in opaque systems
Fuente:
arXiv
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Preprint |
| Published: |
2024
|
| Subjects: | |
| Online Access: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1866929454157135872 |
|---|---|
| author | Gareyan, V. Margaryan, N. Gevorkian, Zh. |
| author_facet | Gareyan, V. Margaryan, N. Gevorkian, Zh. |
| contents | How to make a material anti-reflective without changing its high refraction index? Achieving anti-reflection in high-refractive-index materials poses challenges due to their high reflectivity (Fresnel equations). Based on theory with new boundary conditions, we propose modifying surface properties on a nanoscale to tackle this. Our study on weakly rough opaque surfaces reveals significant changes in specular and diffuse scattering, predicting anti-reflection where roughness matches light penetration depth for the first time. Experimental validation on nano-roughened Si films (at wavelengths 300-400 nm) supports our findings. We also analyze angular and polarization dependences of nanoroughness-induced haze, showing predominant p-polarization and minimal haze at nanoscale, yet impactful specular reflection reduction. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2408_05014 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Nanoroughness induced anti-reflection and haze effects in opaque systems Gareyan, V. Margaryan, N. Gevorkian, Zh. Optics Disordered Systems and Neural Networks How to make a material anti-reflective without changing its high refraction index? Achieving anti-reflection in high-refractive-index materials poses challenges due to their high reflectivity (Fresnel equations). Based on theory with new boundary conditions, we propose modifying surface properties on a nanoscale to tackle this. Our study on weakly rough opaque surfaces reveals significant changes in specular and diffuse scattering, predicting anti-reflection where roughness matches light penetration depth for the first time. Experimental validation on nano-roughened Si films (at wavelengths 300-400 nm) supports our findings. We also analyze angular and polarization dependences of nanoroughness-induced haze, showing predominant p-polarization and minimal haze at nanoscale, yet impactful specular reflection reduction. |
| title | Nanoroughness induced anti-reflection and haze effects in opaque systems |
| topic | Optics Disordered Systems and Neural Networks |
| url | https://arxiv.org/abs/2408.05014 |