Long working distance portable smartphone microscopy for metallic mesh defect detection

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Lu, Zhengang, Qin, Hongsheng, Li, Jing, Sun, Ming, Tan, Jiubin
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2408.05518