Data-Efficient Prediction of Minimum Operating Voltage via Inter- and Intra-Wafer Variation Alignment

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yin, Yuxuan, Chen, Rebecca, He, Chen, Li, Peng
Format:	Preprint
Published:	2024
Subjects:	Systems and Control
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2408.06254