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Main Author: Most, Thomas
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2408.06664
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author Most, Thomas
author_facet Most, Thomas
contents In this paper, a Monte Carlo based approach for the quantification of the importance of the scattering input parameters with respect to the failure probability is presented. Using the basic idea of the alpha-factors of the First Order Reliability Method, this approach was developed to analyze correlated input variables as well as arbitrary marginal parameter distributions. Based on an efficient transformation scheme using the importance sampling principle, only a single analysis run by a plain or variance-reduced Monte Carlo method is required to give a sufficient estimate of the introduced parameter sensitivities. Several application examples are presented and discussed in the paper.
format Preprint
id arxiv_https___arxiv_org_abs_2408_06664
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Efficient variance-based reliability sensitivity analysis for Monte Carlo methods
Most, Thomas
Computation
Probability
In this paper, a Monte Carlo based approach for the quantification of the importance of the scattering input parameters with respect to the failure probability is presented. Using the basic idea of the alpha-factors of the First Order Reliability Method, this approach was developed to analyze correlated input variables as well as arbitrary marginal parameter distributions. Based on an efficient transformation scheme using the importance sampling principle, only a single analysis run by a plain or variance-reduced Monte Carlo method is required to give a sufficient estimate of the introduced parameter sensitivities. Several application examples are presented and discussed in the paper.
title Efficient variance-based reliability sensitivity analysis for Monte Carlo methods
topic Computation
Probability
url https://arxiv.org/abs/2408.06664