Spontaneous damage annealing reactions as a possible source of low energy excess in semiconductor detectors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Nordlund, Kai, Kong, Fanhao, Djurabekova, Flyura, Heikinheimo, Matti, Tuominen, Kimmo, Mirabolfathi, Nader, Kuronen, Antti
Format:	Preprint
Published:	2024
Subjects:	Materials Science High Energy Physics - Experiment
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2408.07518