ALTBI: Constructing Improved Outlier Detection Models via Optimization of Inlier-Memorization Effect

Fuente: arXiv
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Autori principali: Cho, Seoyoung, Hwang, Jaesung, Bak, Kwan-Young, Kim, Dongha
Natura: Preprint
Pubblicazione: 2024
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author Cho, Seoyoung
Hwang, Jaesung
Bak, Kwan-Young
Kim, Dongha
author_facet Cho, Seoyoung
Hwang, Jaesung
Bak, Kwan-Young
Kim, Dongha
contents Outlier detection (OD) is the task of identifying unusual observations (or outliers) from a given or upcoming data by learning unique patterns of normal observations (or inliers). Recently, a study introduced a powerful unsupervised OD (UOD) solver based on a new observation of deep generative models, called inlier-memorization (IM) effect, which suggests that generative models memorize inliers before outliers in early learning stages. In this study, we aim to develop a theoretically principled method to address UOD tasks by maximally utilizing the IM effect. We begin by observing that the IM effect is observed more clearly when the given training data contain fewer outliers. This finding indicates a potential for enhancing the IM effect in UOD regimes if we can effectively exclude outliers from mini-batches when designing the loss function. To this end, we introduce two main techniques: 1) increasing the mini-batch size as the model training proceeds and 2) using an adaptive threshold to calculate the truncated loss function. We theoretically show that these two techniques effectively filter out outliers from the truncated loss function, allowing us to utilize the IM effect to the fullest. Coupled with an additional ensemble strategy, we propose our method and term it Adaptive Loss Truncation with Batch Increment (ALTBI). We provide extensive experimental results to demonstrate that ALTBI achieves state-of-the-art performance in identifying outliers compared to other recent methods, even with significantly lower computation costs. Additionally, we show that our method yields robust performances when combined with privacy-preserving algorithms.
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id arxiv_https___arxiv_org_abs_2408_09791
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publishDate 2024
record_format arxiv
spellingShingle ALTBI: Constructing Improved Outlier Detection Models via Optimization of Inlier-Memorization Effect
Cho, Seoyoung
Hwang, Jaesung
Bak, Kwan-Young
Kim, Dongha
Machine Learning
Outlier detection (OD) is the task of identifying unusual observations (or outliers) from a given or upcoming data by learning unique patterns of normal observations (or inliers). Recently, a study introduced a powerful unsupervised OD (UOD) solver based on a new observation of deep generative models, called inlier-memorization (IM) effect, which suggests that generative models memorize inliers before outliers in early learning stages. In this study, we aim to develop a theoretically principled method to address UOD tasks by maximally utilizing the IM effect. We begin by observing that the IM effect is observed more clearly when the given training data contain fewer outliers. This finding indicates a potential for enhancing the IM effect in UOD regimes if we can effectively exclude outliers from mini-batches when designing the loss function. To this end, we introduce two main techniques: 1) increasing the mini-batch size as the model training proceeds and 2) using an adaptive threshold to calculate the truncated loss function. We theoretically show that these two techniques effectively filter out outliers from the truncated loss function, allowing us to utilize the IM effect to the fullest. Coupled with an additional ensemble strategy, we propose our method and term it Adaptive Loss Truncation with Batch Increment (ALTBI). We provide extensive experimental results to demonstrate that ALTBI achieves state-of-the-art performance in identifying outliers compared to other recent methods, even with significantly lower computation costs. Additionally, we show that our method yields robust performances when combined with privacy-preserving algorithms.
title ALTBI: Constructing Improved Outlier Detection Models via Optimization of Inlier-Memorization Effect
topic Machine Learning
url https://arxiv.org/abs/2408.09791