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Main Authors: Heine, Sarah N. T., Marshall, Herman L., Schneider, Benjamin, Lamar, Beverly, Kothnur, Nithya, Garner, Alan
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2408.11168
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author Heine, Sarah N. T.
Marshall, Herman L.
Schneider, Benjamin
Lamar, Beverly
Kothnur, Nithya
Garner, Alan
author_facet Heine, Sarah N. T.
Marshall, Herman L.
Schneider, Benjamin
Lamar, Beverly
Kothnur, Nithya
Garner, Alan
contents The MIT X-ray Polarimetry Beamline is a facility that we developed for testing components for possible use in X-ray polarimetry. Over the past few years, we have demonstrated that the X-ray source can generate nearly 100% polarized X-rays at various energies from 183 eV (Boron K$α$) to 705 eV (Fe L$α$) using a laterally graded multilayer coated mirror (LGML) oriented at 45° to the source. The position angle of the polarization can be rotated through a range of roughly 150°. In a downstream chamber, we can orient a Princeton Instruments MTE1300B CCD camera to observe the polarized light either directly or after reflection at 45° by a second LGML. In support of the REDSoX Polarimeter project, we have tested four other detectors by directly comparing them to the PI camera. Two were CCD cameras: a Raptor Eagle XV and a CCID94 produced by MIT Lincoln Laboratories, and two had sCMOS sensors: the Sydor Wraith with a GSENSE 400BSI sensor and a custom Sony IMX290 sensor. We will show results comparing quantum efficiencies and event images in the soft X-ray band.
format Preprint
id arxiv_https___arxiv_org_abs_2408_11168
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Characterization of X-ray Detectors in the MIT X-ray Polarimetry Beamline
Heine, Sarah N. T.
Marshall, Herman L.
Schneider, Benjamin
Lamar, Beverly
Kothnur, Nithya
Garner, Alan
Instrumentation and Methods for Astrophysics
The MIT X-ray Polarimetry Beamline is a facility that we developed for testing components for possible use in X-ray polarimetry. Over the past few years, we have demonstrated that the X-ray source can generate nearly 100% polarized X-rays at various energies from 183 eV (Boron K$α$) to 705 eV (Fe L$α$) using a laterally graded multilayer coated mirror (LGML) oriented at 45° to the source. The position angle of the polarization can be rotated through a range of roughly 150°. In a downstream chamber, we can orient a Princeton Instruments MTE1300B CCD camera to observe the polarized light either directly or after reflection at 45° by a second LGML. In support of the REDSoX Polarimeter project, we have tested four other detectors by directly comparing them to the PI camera. Two were CCD cameras: a Raptor Eagle XV and a CCID94 produced by MIT Lincoln Laboratories, and two had sCMOS sensors: the Sydor Wraith with a GSENSE 400BSI sensor and a custom Sony IMX290 sensor. We will show results comparing quantum efficiencies and event images in the soft X-ray band.
title Characterization of X-ray Detectors in the MIT X-ray Polarimetry Beamline
topic Instrumentation and Methods for Astrophysics
url https://arxiv.org/abs/2408.11168