High-quality imaging of large areas through path-difference ptychography
Fuente:
arXiv
Enregistré dans:
| Auteurs principaux: | , , , , , |
|---|---|
| Format: | Preprint |
| Publié: |
2024
|
| Sujets: | |
| Accès en ligne: | |
| Tags: |
Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
|
| _version_ | 1866913475459022848 |
|---|---|
| author | Cui, Jizhe Zheng, Yi Sun, Kang Yang, Wenfeng Sha, Haozhi Yu, Rong |
| author_facet | Cui, Jizhe Zheng, Yi Sun, Kang Yang, Wenfeng Sha, Haozhi Yu, Rong |
| contents | Tilting planar samples for multi-zone-axes observation is a routine procedure in electron microscopy. However, this process invariably introduces optical path differences in the electron beam across different sample positions, significantly compromising image quality, particularly over large fields of view. To address this challenge, we developed path difference ptychography (PDP), a method capable of decoupling path differences from the four-dimensional data during reconstruction. This enables the acquisition of high-quality, large-scale images, facilitating a more comprehensive understanding and analysis of materials microstructure. Moreover, PDP has the potential to promote the widespread application of ptychographic tomography in the analysis of planar samples. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2408_11332 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | High-quality imaging of large areas through path-difference ptychography Cui, Jizhe Zheng, Yi Sun, Kang Yang, Wenfeng Sha, Haozhi Yu, Rong Materials Science Optics Tilting planar samples for multi-zone-axes observation is a routine procedure in electron microscopy. However, this process invariably introduces optical path differences in the electron beam across different sample positions, significantly compromising image quality, particularly over large fields of view. To address this challenge, we developed path difference ptychography (PDP), a method capable of decoupling path differences from the four-dimensional data during reconstruction. This enables the acquisition of high-quality, large-scale images, facilitating a more comprehensive understanding and analysis of materials microstructure. Moreover, PDP has the potential to promote the widespread application of ptychographic tomography in the analysis of planar samples. |
| title | High-quality imaging of large areas through path-difference ptychography |
| topic | Materials Science Optics |
| url | https://arxiv.org/abs/2408.11332 |